Publication:
Test sequence generation for controller verification and test with high coverage

dc.contributor.authorGören, Sezer
dc.contributor.authorFerguson, F. Joel
dc.contributor.institutionGören, Sezer, Bahçeşehir Üniversitesi, Istanbul, Turkey, Department of Computer Engineering, Bahçeşehir Üniversitesi, Istanbul, Turkey
dc.contributor.institutionFerguson, F. Joel, University of California, Santa Cruz, Santa Cruz, United States, Baskin School of Engineering, Santa Cruz, United States
dc.date.accessioned2025-10-05T16:50:59Z
dc.date.issued2006
dc.description.abstractVerification and test are critical phases in the development of any hardware or software system. This article focuses on black box testing of the control part of hardware and software systems. Black box testing involves specification, test generation, and fault coverage. Finite state machines (FSMs) are commonly used for specifying controllers. FSMs may have shortcomings in modeling complex systems. With the introduction of X-machines, complex systems can be modeled at higher levels of abstraction. An X-machine can be converted into an FSM while preserving the level of abstraction. The fault coverage of a test sequence for an FSM specification provides a confidence level. We propose a fault coverage metric for an FSM specification based on the transition fault model, and using this metric, we derive the coverage of a test sequence. The article also presents a method which generates short test sequences that meet a specific coverage level and then extends this metric to determine the coverage of a test sequence for an FSM driven by an FSM network. We applied our FSM verification technique to a real-life FSM, namely, the fibre channel arbitrated loop port state machine, used in the field of storage area networks. © 2006 ACM. © 2011 Elsevier B.V., All rights reserved.
dc.identifier.doi10.1145/1179461.1179467
dc.identifier.endpage938
dc.identifier.issn10844309
dc.identifier.issn15577309
dc.identifier.issue4
dc.identifier.scopus2-s2.0-33750974797
dc.identifier.startpage916
dc.identifier.urihttps://doi.org/10.1145/1179461.1179467
dc.identifier.urihttps://hdl.handle.net/20.500.14719/13983
dc.identifier.volume11
dc.language.isoen
dc.relation.sourceACM Transactions on Design Automation of Electronic Systems
dc.subject.authorkeywordsBlack Box Testing
dc.subject.authorkeywordsFault Coverage
dc.subject.authorkeywordsFinite State Machine
dc.subject.authorkeywordsX-machine
dc.titleTest sequence generation for controller verification and test with high coverage
dc.typeArticle
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dspace.entity.typePublication
local.indexed.atScopus
person.identifier.scopus-author-id15055808900
person.identifier.scopus-author-id7005043277

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