Publication: Test sequence generation for controller verification and test with high coverage
| dc.contributor.author | Gören, Sezer | |
| dc.contributor.author | Ferguson, F. Joel | |
| dc.contributor.institution | Gören, Sezer, Bahçeşehir Üniversitesi, Istanbul, Turkey, Department of Computer Engineering, Bahçeşehir Üniversitesi, Istanbul, Turkey | |
| dc.contributor.institution | Ferguson, F. Joel, University of California, Santa Cruz, Santa Cruz, United States, Baskin School of Engineering, Santa Cruz, United States | |
| dc.date.accessioned | 2025-10-05T16:50:59Z | |
| dc.date.issued | 2006 | |
| dc.description.abstract | Verification and test are critical phases in the development of any hardware or software system. This article focuses on black box testing of the control part of hardware and software systems. Black box testing involves specification, test generation, and fault coverage. Finite state machines (FSMs) are commonly used for specifying controllers. FSMs may have shortcomings in modeling complex systems. With the introduction of X-machines, complex systems can be modeled at higher levels of abstraction. An X-machine can be converted into an FSM while preserving the level of abstraction. The fault coverage of a test sequence for an FSM specification provides a confidence level. We propose a fault coverage metric for an FSM specification based on the transition fault model, and using this metric, we derive the coverage of a test sequence. The article also presents a method which generates short test sequences that meet a specific coverage level and then extends this metric to determine the coverage of a test sequence for an FSM driven by an FSM network. We applied our FSM verification technique to a real-life FSM, namely, the fibre channel arbitrated loop port state machine, used in the field of storage area networks. © 2006 ACM. © 2011 Elsevier B.V., All rights reserved. | |
| dc.identifier.doi | 10.1145/1179461.1179467 | |
| dc.identifier.endpage | 938 | |
| dc.identifier.issn | 10844309 | |
| dc.identifier.issn | 15577309 | |
| dc.identifier.issue | 4 | |
| dc.identifier.scopus | 2-s2.0-33750974797 | |
| dc.identifier.startpage | 916 | |
| dc.identifier.uri | https://doi.org/10.1145/1179461.1179467 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14719/13983 | |
| dc.identifier.volume | 11 | |
| dc.language.iso | en | |
| dc.relation.source | ACM Transactions on Design Automation of Electronic Systems | |
| dc.subject.authorkeywords | Black Box Testing | |
| dc.subject.authorkeywords | Fault Coverage | |
| dc.subject.authorkeywords | Finite State Machine | |
| dc.subject.authorkeywords | X-machine | |
| dc.title | Test sequence generation for controller verification and test with high coverage | |
| dc.type | Article | |
| dcterms.references | Cheng, Kwang Ting Tim, Functional test generation for finite state machines, pp. 162-168, (1990), Chockler, Hana, A practical approach to coverage in model checking, Lecture Notes in Computer Science, 2102, pp. 66-78, (2001), Clarke, Edmund Melson, Design and synthesis of synchronization skeletons using branching time temporal logic, Lecture Notes in Computer Science, 131 LNCS, pp. 52-71, (1982), Dahbura, Anton T., Optimal test sequence for the JTAG/IEEE P1149.1 test access port controller, pp. 55-62, (1989), Automata Machines and Languages, (1974), Fallah, Farzan, Functional vector generation for sequential HDL models under an observability-based code coverage metric, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 10, 6, pp. 919-923, (2002), Ferrandi, Fabrizio, Symbolic optimization of interacting controllers based on redundancy identification and removal, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 19, 7, pp. 760-772, (2000), Ghosh, Abhijit, Test Generation and Verification for Highly Sequential Circuits, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 10, 5, pp. 652-667, (1991), Gören, Sezer, Checking sequence generation for asynchronous sequential elements, IEEE International Test Conference (TC), pp. 406-413, (1999), Gören, Sezer, Testing finite state machines based on a structural coverage metric, IEEE International Test Conference (TC), pp. 773-780, (2002) | |
| dspace.entity.type | Publication | |
| local.indexed.at | Scopus | |
| person.identifier.scopus-author-id | 15055808900 | |
| person.identifier.scopus-author-id | 7005043277 |
